Sony IMX711-AABY

The Sony IMX711-AABY is a direct-conversion, integration-type X-ray CMOS image sensor developed for scientific instrumentation, advanced X-ray measurement and high-speed device inspection systems. The sensor detects X-rays and electron beams directly and combines high-speed capture, excellent energy resolution and wide dynamic range in one device.

With its low-noise readout, the IMX711 supports the detection of weak X-ray signals with single-photon sensitivity under low-flux conditions. At the same time, its integration-type architecture enables stable measurement under high-flux conditions, supporting reliable data acquisition across a wide range of X-ray intensities.

Stacked direct-conversion architecture

At the core of the sensor is a stacked structure combining a 650 µm thick FZ silicon photodiode substrate with a dedicated signal-processing chip. This architecture enables direct X-ray conversion together with high-speed readout, low-noise performance and wide dynamic-range measurement.

The IMX711 is designed for long-term operation in demanding X-ray environments and supports measurement scenarios where both weak signal detection and stable high-flux performance are required.

High-speed readout with flexible ROI modes

The sensor provides 384 × 728 active pixels, corresponding to 279,536 pixels excluding 16 black pixels, with a large 72.6 µm square pixel pitch. It supports 12-bit A/D conversion, in-pixel CDS, automatic gain selection and multiple readout modes.

In all-pixel scan mode, the IMX711 reaches up to 26.1 k frames/s. For applications requiring even higher temporal resolution, ROI readout enables up to 117.5 k frames/s in 1/8 ROI mode.

High-bandwidth system integration

For system integration, the IMX711 uses high-speed SLVS-EC serial output with 48 lanes at 2.88 Gbps per lane. This makes it suitable for detector architectures where large amounts of measurement data must be transferred at high speed.

The sensor also supports 1/2, 1/4 and 1/8 ROI functions, A/D multisampling, gain selection and built-in digital logic for automatic gain selection. Its 4-side tiling capability also supports scalable detector designs for larger detection areas.

Rich measurement data for advanced analysis

Because the IMX711 can simultaneously acquire spatial, temporal and energy information in a single measurement, it can support more flexible data analysis and post-processing. This is especially valuable in scientific measurement, materials research, life sciences, structural analysis and advanced device inspection, where the quality and completeness of measurement data directly influence analysis accuracy.

The sensor’s energy information can be used to select relevant energy ranges after measurement. This supports efficient analysis workflows and can help improve measurement precision without relying only on physical pre-filtering.